Coupled with the Laser Ablation Atomizer hyphenated to ICP-MS becomes LA-ICPMS which can achieve solid-state direct sampling, reducing matrix interferences etc. The overall performance of the instrument remains stable, and all elements demonstrate excellent linearity in calibration build and routine sample analysis. The results of content accuracy comparison strongly confirm the outstanding accuracy. The potential of this hyphenated technology in the analysis of trace element distribution on material surfaces, whether in Semiconductor or others proves it's effectiveness as a powerful detection technique surface analysis and for ore mineral composition
Spectral range: Full spectrum from 2 to 255 amu, ideal for major and trace element analysis in environmental analysis, geology and materials science.
High precision and sensitivity: Enables detailed analysis of trace elements even in complex matrices, such as in environmental analysis, geology and materials science.
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